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Types of CVD | Properties | Advantages | Disadvantages |
APCVD | - 76~760 Torr - Chemical raction by thermal energy - Used in SiO2 deposition - Coldwall Reactor |
- Low temperature - Simple reactor - Fast Deposition Rate (70nm/min) |
- Poor step coverage - 다량의 Carrier gas waste - Particle Contamination - Low throughput (cause of wafer loading) - Frequent Cleaning Required |
LPCVD | - Low pressure (0.25~2Torr) - 10~50nm/min - SiO2, Poly Si, W, Si3N4 Deposition - Hot-wall reactor (for prcise control) - Low gas pressure (no carrier gas) |
- Large wafer capacity - High Uniformity - Good Step Coverage - Low cost (because of batch process) |
- Sensitive Rate Control (sensitive to temperature) - High Temperature (500~1200C) |
PECVD | - Energy supplied by plasma - Low temperature (300~400C) - Nitride passivation layer deposition(고온공정 불가능한 경우 사용) |
- High deposition rate (than LPCVD) - Low pinhole density (good film density) - Good Step Coverage |
- Particle&Chemical Contamination - Low Uniformity - 조성비가 좋지 않음 |
MOCVD | - Metal-organic precursor 사용 - decomposition at low temperature - compound semiconductor의 경우 MOCVD 사용 |
- Growth Rate Control - Good Step Coverage - Low defects |
-Toxic, Explosive Gas |
CVD vs PVD | CVD is the process that deposits film through chemical reaction and surface adsorption without changing the substrate properties | - Higher growth rate possible - Can deposit materials hard to evaporate (poly Si, SiO2, Si3N4, ....) - can grow epitaxial film - more conformal step coverage + uniformity |
- Higher temperature - Complex process - Toxic, Corrosive Has |
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