unconventional nanopatterning methods for cost-effective and simple integration of STTMRAM
for high-density memory arrays
the deposition of pMTJ stack (i) on pre-patterned non magnetic
conducting nano-pillars with undercut and (ii) in pre-patterned nano-holes with collimator
structure.
The first method consists in depositing the MTJ stacks on pre-patterned non-magnetic
conducting pillars with undercut to avoid deposition on the sidewalls of the conducting
pillars.
Here, the interface
roughness of the pre-patterned nanopillars is an important parameter to control as the
pMTJ stacks are deposited on it.
Different masks (MA-N resist, Cr and Pt) have been
investigated to etch Ta pillars. Among them Pt worked best. Using Pt masks, and
controlling the reactive ion etching parameters, Ta nano-pillars with different diameters,
down to 30 nm, have been realized with undercut.
The second approach of nanopatterning MTJs consists in depositing simple magnetic
tunnel junctions by sputtering and e-beam evaporation into nano-holes.
6.1 MOTIVATION
Therefore, to make STT-MRAM applicable for high-density
memory applications, such as for DRAM replacement, an unconventional nano-patterning
process must be investigated.
In this chapter, I will discuss two unconventional pattering
methods of STT-MRAM: (a) Depositing pMTJ stacks on pre-patterned conducting nanopillars
and (b) Depositing pMTJ stacks in pre-patterned nano-holes.
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